Wafer-level packaging is a wafer-level package, wafer-level test of many MEMS structures on a wafer, and then split into a complete vacuum-tight infrared detector, suitable for high-volume and low-cost production and application.
Features:
• High performance at low cost;
• Ultra-small size, ultra-light weight;
• High sensitivity and excellent imaging quality;
Application:
• Smart Home
• Consumer Electronics
• Internet of Things
• Automatic Driving
• Industrial Inspection
• Security/Surveillance
• Personal Vision
• Firefighting
| Model | GST412W | GST212W | GST117W |
| Material | VOx |
| Resolution | 400X300 | 256X192 | 120X90 |
| Pixel Pitch | 12μm | 17μm |
| Spectral Range | 8-14μm |
| NETD | <40mK |
| Digital Output | Built-in 14 bits ADC |
| Typical Responsivity | 15mV/K |
| Thermal Response Time | <12ms |
| Frame Rate | 50/60Hz |
| Power Consumption | <200mW | <120mW | <35mW |
| Dimension(mm) | 9.6x11.4x1.57 | 6.2x7.3x1.57 | 5.3x5.8x1.57 |
| Weight | <0.5g | <0.5g | <0.5g |
| Operation Temperature | -40°C ~ +85°C |